Durham University

Department of Physics

Staff profile

Publication details for Professor Ian Smail

Chen, C.-T.J., Brandt, W.N., Luo, B., Ranalli, P., Yang, G., Alexander, D.M., Bauer, F.E., Kelson, D.D., Lacy, M., Nyland, K., Tozzi, P., Vito, F., Cirasuolo, M., Gilli, R., Jarvis, M.J., Lehmer, B.D., Paolillo, M., Schneider, D.P., Shemmer, O., Smail, I., Sun, M., Tanaka, M., Vaccari, M., Vignali, C., Xue, Y.Q., Banerji, M., Chow, K.E., Häu\ssler, B., Norris, R.P., Silverman, J.D. & Trump, J.R. (2018). The XMM-SERVS survey: new XMM-Newton point-source catalogue for the XMM-LSS field. Monthly Notices of the Royal Astronomical Society 478: 2132-2163.

Author(s) from Durham


We present an X-ray point-source catalogue from the XMM-Large Scale Structure (XMM-LSS) survey region, one of the XMM-Spitzer Extragalactic Representative Volume Survey (XMM-SERVS) fields. We target the XMM-LSS region with 1.3 Ms of new XMM–Newton AO-15 observations, transforming the archival X-ray coverage in this region into a 5.3 deg2 contiguous field with uniform X-ray coverage totaling 2.7 Ms of flare-filtered exposure, with a 46 ks median PN exposure time. We provide an X-ray catalogue of 5242 sources detected in the soft (0.5–2 keV), hard (2–10 keV), and/or full (0.5–10 keV) bands with a 1 per cent expected spurious fraction determined from simulations. A total of 2381 new X-ray sources are detected compared to previous source catalogues in the same area. Our survey has flux limits of 1.7 × 10−15, 1.3 × 10−14, and 6.5 × 10−15 erg cm−2 s−1 over 90 per cent of its area in the soft, hard, and full bands, respectively, which is comparable to those of the XMM-COSMOS survey. We identify multiwavelength counterpart candidates for 99.9 per cent of the X-ray sources, of which 93 per cent are considered as reliable based on their matching likelihood ratios. The reliabilities of these high-likelihood-ratio counterparts are further confirmed to be ≈97 per cent reliable based on deep Chandra coverage over ≈5 per cent of the XMM-LSS region. Results of multiwavelength identifications are also included in the source catalogue, along with basic optical-to-infrared photometry and spectroscopic redshifts from publicly available surveys. We compute photometric redshifts for X-ray sources in 4.5 deg2 of our field where forced-aperture multiband photometry is available; >70 per cent of the X-ray sources in this subfield have either spectroscopic or high-quality photometric redshifts.