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Department of Chemistry

Ion Beam Analysis

Services Available

Ion beam analysis is a family of techniques that can be used to measure the elemental composition versus depth of almost any solid material.  For many materials (particularly metals and alloys) the analysis is virtually non-destructive.  The depth resolution is of the order of a few nanometers, and range of measurement can be tens of microns.  Data acquisition is rapid (tens of minutes) and sample preparation is straightforward compared to most other surface analysis techniques.  Data analysis is remarkably unambiguous and does not rely on calibration standards as with other elemental analysis techniques

Contact Details

Dr Pamela Robinson
Analytical Services Coordinator
+44 (0)191 334 4646