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Publication details for Prof Brian TannerPym, ATG, Ruhrig, M & Tanner, BK (2010). Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing. Journal Of Applied Physics 107(9): 093524
- Publication type: Journal Article
- ISSN/ISBN: 0021-8979, 1089-7550
- DOI: 10.1063/1.3366707
- Keywords: Magnetic tunnel-junctions, Room-temperature, AL203 barriers, Aluminium compounds, Annealing, Cobalt compounds, Magnetoresistance, Ferromagnetic materials, Interface roughness, Interface structure, Iron compounds, Magnetic multilayers, X-ray scattering.
- Further publication details on publisher web site
- Durham Research Online (DRO) - may include full text
Author(s) from Durham
Sputtered multilayers of Co0.6Fe0.2B0.2 and AlOx have been measured using grazing incidence x-ray scattering to determine the changes in layer and interface structure during in situ annealing. We confirm our earlier deduction of a sharpening of the interfaces on annealing up to 400 °C. This sharpening arises from reduction in chemical intermixing, not from change in topological roughness and provides an explanation for the enhanced tunneling magnetoresistance. The annealing is shown to result in a decrease in Co0.6Fe0.2B0.2 mean layer thickness and increase in the layer density. There is a commensurate increase in AlOx mean layer thickness while at the same time there is a reduction in the layer density. The increase in thickness could explain the corresponding increase observed in the resistance-area product.
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