Staff and Governance
The day-to-day running of IMEMS is the responsibility of the Core Executive Committee, comprising the Director and Associate Directors and the Administrator.
Publication details for Prof Brian TannerLoxley, N., Bowen, D.K. & Tanner, B.K. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS Proceedings 208: 119-124.
- Publication type: Journal Article
- ISSN/ISBN: 0272-9172, 1946-4274
- DOI: 10.1557/proc-208-119
- Further publication details on publisher web site
Author(s) from Durham
A new desk-side double-axis X-ray diffractometer capable of rapid, automatic measurement of lattice mismatch between epitaxial thin films and substrate in a two dimensional grid 150 mm square has been built. The design principles behind the five independent axis systems, specimen loading, and the fail-to-safety X-ray shutter are elucidated, and examples of typical data from substrate material and thin epitaxial films of III-V compounds are presented.
Full Executive Committee
Our Full Executive Committee is made up of the Core Executive Committee, listed above, plus a number of executive members including:
International Advisory Board
We are extremely fortunate to have be able to call on the help and guidance of colleagues from around the world who help to shape and guide our direction, strategy and international reach. Our current Advisory Board members are: