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Publication details for Prof Brian TannerBuchanan, J. D. R., Hase, T. P. A., Tanner, B. K., Hughes, N. D. & Hicken, R. J. (2002). Determination of the thickness of Al2O3 barriers in magnetic tunnel junctions. Applied Physics Letters 81(4): 751-753.
- Publication type: Journal Article
- ISSN/ISBN: 0003-6951, 1077-3118
- DOI: 10.1063/1.1496131
- Keywords: Aluminum oxides, Cobalt, Electron spin, Electron tunneling, Ferromagnetic materials, Grazing incidence, Insulation, Insulators, Magnetic materials, Magnetic properties, Magnetoresistivity, MIM (semiconductors), Permalloys (trademark), Polarization.
- Further publication details on publisher web site
- Durham Research Online (DRO) - may include full text
Author(s) from Durham
The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier structure, revealing a substantial increase in Al2O3 thickness with oxidation. The greater thickness of barrier measured using grazing incidence x-ray reflectivity compared with that obtained by fitting current density-voltage to the Simmons electron tunneling model suggests that electron tunneling is localized to specific regions across the barrier, where the thickness is reduced by fluctuations due to nonconformal roughness.
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