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The day-to-day running of IMEMS is the responsibility of the Core Executive Committee, comprising the Director and Associate Directors and the Administrator.
Publication details for Prof Brian TannerLafford, T. A., Ryan, P. A., Joyce, D. E., Goorsky, M. S. & Tanner, B. K. (2003). Direct measurement of twist mosaic in epitaxial GaN. physica status solidi (a) 195(1): 265-270.
- Publication type: Journal Article
- ISSN/ISBN: 0031-8965, 1862-6319
- DOI: 10.1002/pssa.200306270
- Further publication details on publisher web site
Author(s) from Durham
The laboratory application of grazing incidence in-plane X-ray diffraction to the measurement of the in-plane (twist) mosaic of GaN epitaxial layers is demonstrated. Only a single measurement containing no extrapolation uncertainty is required. The resolution and intensity are determined for the double axis geometry under different beam conditioning arrangements from a microfocus X-ray tube and a standard sealed source.
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