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Durham University

GJ Russell Electron Microscopy Facility


Nanowires are being investigated for potential application in optoelectronic devices, such as solar cells and light emitting diodes. Electron microscopy is an essential tool for their characterisation. For example secondary electron imaging in the SEM can give information on the density, length and diameter of the nanowires as grown on the substrate. TEM-based techniques, such as high resolution electron microscopy and electron diffraction, provide information on the crystal structure, growth axis and atomic-scale defects in the nanowire.