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Electron Microscopy

Facilities

Scanning electron microscopes


Hitachi SU-70 FEG SEM

 

Transmission electron microscopes


JEOL 2100F FEG TEM

JEOL 1200EX TEM

 

Focused ion-beam electron microscopes


FEI Helios NanoLabTM

 

Specimen preparation


• Buehler specimen preparation equipment:

     - SimpliMet 1000 mounting press for embedding samples in bakelite

     - Delta Abrasimet saw for bulk sectioning

     - Isomet 5000 saw for precision sectioning of small and brittle materials

     - Handimet 2 Roll Grinder for coarse grinding of specimens

     - MetaServ 3000 variable speed grinder-polisher (x3)

• GATAN precision ion-polishing system:

     - Ar ion-milling at low beam energies and shallow angles (≥ 1 degree)

• GATAN Solarus plasma cleaner:

     - Plasma cleaning of TEM and SEM specimens to reduce contamination

     - Option of Ar/O2 or H2/O2 gas mixture (the latter can be used for cleaning holey carbon films)

• GATAN TEM disc dimple grinder

• GATAN Ultrasonic cutter

• Buehler Tripod polishing unit