Due to the high spatial resolution in electron microscopy diffraction data can be obtained from regions as small as a few nanometres, thus avoiding the need for growing large single crystals as in X-ray diffraction. Furthermore the strong dynamic interaction of the electron beam with the sample makes it an ideal technique for analysing weak reflections, such as, for example, superstructure reflections. Techniques such as selected area electron diffraction and convergent beam electron diffraction in the TEM provide information on the lattice parameters, space group etc. of the crystal. Electron back scattered diffraction (EBSD) in the SEM is a rapid method to characterise grain orientations and texturing over a larger field of view.