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Electron Microscopy

Chemical Mapping

A unique advantage of electron microscopy is the ability to acquire different signals from the same region of interest at high spatial resolution. This includes, for example, the structure of the material and its chemical composition. Energy dispersive X-ray (EDX) in the SEM and TEM can not only identify the chemical elements present but also quantify their concentration. Furthermore electron energy loss spectroscopy (EELS), which has a higher energy resolution, provides additional information on atomic bonding as well as plasmons, dielectric constants etc.