View Profile
Publication details for Prof Peter Hatton
Lin, WJ, Hatton, PD, Baudenbacher, F & Santiso, J (1998). A high-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin films. Physica B-condensed Matter 248: 56-61.- Publication type: Journal papers: academic
- ISSN/ISBN: 0921-4526
- Keywords: X-ray diffraction and scattering; interface structure and roughness; structure and morphology; thickness; high-T-c filmsDIFFRACTION; REFLECTIVITY; ROUGHNESS