Staff profile
Publication details for Prof Brian Tanner
Eaglesham, D. J., Kvam, E. P., Maher, D. M., Humphreys, C. & J., Green, G. S., Tanner, B. K. and Bean, J. C. (1988). X-ray topography of the coherency breakdown in GexSi1 - x/Si(100). Applied Physics Letters 53: 2083-2085.- Publication type: Journal papers: academic
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