Publication details for Prof Brian TannerBarnett, S. J., Whitehouse, C. R., Keir, A. M., Clark, G. & F., Usher, B., Tanner, B. K., Emeny, M. T. and Johnson, A. D. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D Applied Physics 26: A45-A49.
- Publication type: Journal papers: academic
- View online: Online version