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Publication details for Dr Neal Wade
Chen, Minyou, Yu, Lei, Wade, Neal S., Liu, Xiaoqin, Liu, Qing & Yang, Fan (2011). Investigation on the Faulty State of DFIG in a Microgrid. IEEE transactions on power electronics 26(7): 1913-1919.- Publication type: Journal papers: academic
- ISSN/ISBN: 0885-8993
- DOI: 10.1109/TPEL.2010.2094626
- View online: Online version